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SU1510
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- The footprint of the SU1510 has been reduced by 20% so that the microscope can be installed in more restricted places than before.
- To assist inexperienced users the SU1510 includes an on screen operation guide that walks the user step by step through the complete imaging process-from vacuum mode selection to taking a picture.
- Variable pressure mode for observation of non-conductive samples without the need for metal coating.
- High throughput, less floor space, less electric power consumption, with no cooling water requirement due to TMP evacuation system.
Á¦Ç°»ç¾ç(Specification)
(1) Resolution |
---|
SE : 3.0nm at 30kV (High Vacuum Mode) BSE : 4.0nm at 30kV (Low Vacuum Mode) |
(2) Magnification |
x5 to x300,000 (continuous) |
(3) Accelerating voltage |
0.3 to 30kV |
(4) Bias system |
Quadrant bias system (HITACHI patent) |
(5) Detectors |
Everhart Thornley Secondary Electron Detector High sensitivity 5 segments BSE detector |
(6) Low Vacuum Range |
6 to 270Pa through graphic menu |
(7) Maximum loading sample size |
153mm dia. X 60mm H |
(8) Image saving |
Max. 5,120 x 3,840 pixels |
SU3500
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- The SU3500 employs a new low-aberration objective lens and improved bias function that provides higher emission current at low kV. 7nm SE Image Resolution at 3kV, 10nm BSE Image resolution at 5kV.
- Unparalleled Image Quality : Novel and innovative electron optics and image display rendering engine
- Robustness & Versatility : Image observation and analysis without traditional specimen preparation techniques
- Intuitive Operation : Delegation technology affords easy operation and increased throughput efficiency
- Multi-Functional, Automated Specimen Stage : Enhanced navigation via new analytical chamber and automated stage functions
- The newly designed vacuum system enables low vacuum settings within the range of 6-650Pa
- The new Ultra Variable-pressure Detector(UVD)* is a highly sensitive detector for low vacuum mode, which is optimized for imaging surface details at low acceleration voltages.
- The new Live Stereoscopic function* provides real time 3D-SEM image without need for specimen tilting.
Á¦Ç°»ç¾ç(Specification)
(1) Resolution |
---|
SE : 3.0nm at 30kV (High Vacuum Mode) / 7nm at 3kV (High Vacuum Mode) BSE : 4.0nm at 30kV (Variable Pressure Mode) / 10.0nm at 5kV (High Vacuum Mode) |
(2) Magnification |
x5 to x300,000 (on photo) x7 to x800,000 (on display) |
(3) Accelerating voltage |
0.3 to 30kV |
(4) Bias system |
Quadrant bias system (HITACHI patent) |
(5) Detectors |
Everhart Thornly Secondary Electron Detector High sensitivity semiconductor BSE detector |
(6) Low Vacuum Range |
6 to 650Pa |
(7) Maximum loading sample size |
200mm dia. x 70mm H (4-axis) 200mm dia. x 80mm H (5-axis) |
(8) Image saving |
Max. 5,120 x 3,840 pixels |
S-3700N
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- Large sample up to 300mm in diameter
- Observable area up to 203mm in diameter
- Observation and EDS analysis on a sample up to 110mm tall and 2kg weight
- EDS, EBSD and WDS simultaneously available
- Versatile port layout for various analytical applications
- 5-axis computer eucentric motorized stage with -20¢ª/+90¢ª tilt
- One-button selectable High Vacuum/Low Vacuum Modes
- Ecological design by clean Turbo Molecular Pumping
Á¦Ç°»ç¾ç(Specification)
(1) Resolution |
---|
SE : 3.0nm at 30kV (High Vacuum Mode) / 10nm at 3kV (High Vacuum Mode) BSE : 4.0nm at 30kV (Low Vacuum Mode) |
(2) Magnification |
x5 to x300,000 (continuous) |
(3) Accelerating voltage |
0.3 to 30kV |
(4) Bias system |
Quadrant bias system (HITACHI patent) |
(5) Detectors |
Everhart Thornley Secondary Electron Detector High sensitivity 5 segments BSE detector |
(6) Low Vacuum Range |
6 to 270Pa through graphic menu |
(7) Specimen stage |
X : 150mm Y : 110mm Z : 5 to 65mm R : 360¢ª T : -20¢ª to +90¢ª Maximum sample size : 300mm dia. X 110mm H |
(8) Pumping system |
TMP x 1 + R.P x 1 |
(9) Image saving |
Max. 5,120 x 3,840 pixels |